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IEAP - Institute of Experimental and Applied Physics CTU - Czech Technical University in Prague
CTU - Czech Technical University in Prague
Publication  > Articles in Impacted Journals  > 'Pixel Detectors for Imaging with Heavy Charged Particles'
Pixel Detectors for Imaging with Heavy Charged Particles

Author

Year
2008

Scientific journal
Nucl. Instr. and Meth. A, Volume: 591, Issue:1, Pages: 155-158, doi: 10.1016/j.nima.2008.03.091

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Abstract
The state-of-the-art single quantum counting pixel detectors offer a large potential for different imaging applications. A TimePix pixel device can provide information about position and energy of the detected radiation allowing radiography with charged particles. Heavy charged particles of known initial energy lose their energy partially by going through a specimen material. If the resulting energies of particles passing the specimen are measured, then specimen structure can be revealed. The article shows experimental results of this technique acquired with alpha particles and the TimePix detector. The spatial resolution in detector plane depends on particle energy and can reach submicrometer level. The specimen thickness can be determined with precision up to 320 nm for organic material if a measurement of energy loss of individual alpha particle is used.


Cite article as:
Z. Vykydal, "Pixel Detectors for Imaging with Heavy Charged Particles", Nucl. Instr. and Meth. A, Volume: 591, Issue:1, Pages: 155-158, doi: 10.1016/j.nima.2008.03.091 (2008)

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