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CTU - Czech Technical University in Prague
Publication  > Articles in Impacted Journals  > 'Slow-neutron-induced charged-particle emission-channeling-measurements with Medipix detectors'
Slow-neutron-induced charged-particle emission-channeling-measurements with Medipix detectors

Author
Vacík Jiří, Ing., CSc. NPI ASCR

Year
2011

Scientific journal
Nucl. Instr. Methods A 633 (2011) S267-S269

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Abstract
The lattice location of helium, lithium, beryllium, boron or sodium host or impurity atoms in single crystals can be studied by slow-neutron-induced charged particle emission channeling measurements. Modern silicon pixel detectors can cover an entire emission channeling pattern in a single measurement and allow reviving this technique for practical applications. We report on the use of the TimePix detector for such emission channeling experiments with samples containing 6Li, 7Be or 10B.

Cite article as:
J. Vacík, "Slow-neutron-induced charged-particle emission-channeling-measurements with Medipix detectors", Nucl. Instr. Methods A 633 (2011) S267-S269 (2011)

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