IEAP - Institute of Experimental and Applied Physics CTU - Czech Technical University in Prague
Česky English
IEAP - Institute of Experimental and Applied Physics CTU - Czech Technical University in Prague
CTU - Czech Technical University in Prague
Publication  > Articles in Impacted Journals  > 'Background capabilities of pixel detectors for double beta decay measurements'
Background capabilities of pixel detectors for double beta decay measurements

Author

Year
2011

Scientific journal
NIM A, Vol. 633, Suppl. 1, May 2011, p. S210-S211, doi:10.1016/j.nima.2010.06.169

Web


Abstract
We discuss the possible use of a progressive detection technique based on pixel detectors for the study of double beta decay processes. A series of background measurements in various environments (surface laboratory, underground laboratory, with and without Pb shielding) was performed using the TimePix silicon hybrid pixel device. The pixel detector response to the natural background and intrinsic background properties measured by a low-background HPGe detector are presented.

Cite article as:
Y. Shitov, "Background capabilities of pixel detectors for double beta decay measurements", NIM A, Vol. 633, Suppl. 1, May 2011, p. S210-S211, doi:10.1016/j.nima.2010.06.169 (2011)

Search
10th Anniversary of IEAP