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CTU - Czech Technical University in Prague
Publication  > Articles in Impacted Journals  > 'Neutron Analysis for Microvoids in an Adhesive Layer between High X-ray Attenuation Materials'
Neutron Analysis for Microvoids in an Adhesive Layer between High X-ray Attenuation Materials

Author
Jeon Insu School of Mechanical Systems Engineering, Chonnam National University, Gwangju, Republic of Korea

Year
2011

Scientific journal
Appl. Phys. Express 4 (2011) 066401

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Abstract
We demonstrate the potential of neutron systems for detecting microscale defects in a thin epoxy adhesive layer between two metal plates. Neutron tomography has been used to ascertain the internal structure of the adhesive layer. The distribution of defects including microvoids is found in three-dimensionally reconstructed models that are obtained from neutron tomography images and is compared with that obtained from a magnified real image of the layer. From the results, we find that a neutron system can be the most suitable tool for detecting microscale defects in a thin adhesive layer that lies between two high X-ray attenuation plates

Cite article as:
I. Jeon, "Neutron Analysis for Microvoids in an Adhesive Layer between High X-ray Attenuation Materials", Appl. Phys. Express 4 (2011) 066401 (2011)

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